Bruker unveiled two New Analytical Accessories for Electron Microscopes.
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| XSense™ |
Introduced today, these new instruments expand its portfolio of
high-performance tools for materials characterization in electron microscopes.
Henceforth we have:
- XSense™, specifically designed for the lower energy range between 100 and 3,600 eV, is a novel parallel beam wavelength dispersive X-ray spectrometer (WDS) for elemental analysis on scanning electron microscopes (SEM). The XSense spectrometer provides energy resolution down to 4 eV, enabling both excellent separation of closely spaced X-ray lines and highly sensitive trace element detection.
- XTrace™ is a new micro-spot X-ray source that enables photon-induced micro X-ray fluorescence (micro-XRF) spectrometry on SEM systems, in conjunction with Bruker’s energy dispersive X-ray spectrometer (EDS) detectors.
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| XTrace™ |
Finally, Both the XSense WDS
analyzer and the XTrace
micro X-ay source are operated via ESPRIT 2.0, Bruker’s new and unique 4-in-1
analytical software suite which seamlessly integrates EDS, WDS, EBSD and
Micro-XRF under a single user interface.
“With
the introduction of these exciting new products we are now offering our
customers unprecedented options to significantly enhance the analytical power
of their electron microscope. As integral parts of our QUANTAX system for
micro- and nano-analysis, both new tools are designed to improve specificity
and sensitivity of the analytical SEM over the full range of the energy
spectrum. The XSense
WDS is dedicated to the low energy, light element region, and the XTrace is
particularly suited to reveal additional analytical information in the
mid-to-high energy range. We are proud that Bruker is now the only vendor to
offer all five techniques, EDS, WDS, EBSD, Micro-XRF and Micro-CT, as
high-performance add-on analyzers for electron microscopes. Due to the full
integration under our new ESPRIT 2.0 software suite, researchers can now
combine and integrate data obtained by these complementary methods. As a
result, our QUANTAX system has now evolved into a true multimodal analytical
toolset for comprehensive materials characterization on electron microscopes."
Said Thomas Schülein, President of the Bruker Nano Analytics division.
About Bruker Corporation
Bruker Corporation (NASDAQ: BRKR) is a leading provider of high performance
scientific instruments and solutions for molecular and materials research, as
well as industrial, diagnostics and applied analysis.
